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Proceedings Paper

Segmenting images analytically in shape space
Author(s): Yogesh Rathi; Samuel Dambreville; Marc Niethammer; James Malcolm; James Levitt; Martha E. Shenton; Allen Tannenbaum
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Paper Abstract

This paper presents a novel analytic technique to perform shape-driven segmentation. In our approach, shapes are represented using binary maps, and linear PCA is utilized to provide shape priors for segmentation. Intensity based probability distributions are then employed to convert a given test volume into a binary map representation, and a novel energy functional is proposed whose minimum can be analytically computed to obtain the desired segmentation in the shape space. We compare the proposed method with the log-likelihood based energy to elucidate some key differences. Our algorithm is applied to the segmentation of brain caudate nucleus and hippocampus from MRI data, which is of interest in the study of schizophrenia and Alzheimer's disease. Our validation (we compute the Hausdorff distance and the DICE coefficient between the automatic segmentation and ground-truth) shows that the proposed algorithm is very fast, requires no initialization and outperforms the log-likelihood based energy.

Paper Details

Date Published: 11 March 2008
PDF: 8 pages
Proc. SPIE 6914, Medical Imaging 2008: Image Processing, 691405 (11 March 2008); doi: 10.1117/12.769511
Show Author Affiliations
Yogesh Rathi, Brigham and Women's Hospital, Harvard Medical School (United States)
Samuel Dambreville, Georgia Institute of Technology (United States)
Marc Niethammer, Brigham and Women's Hospital, Harvard Medical School (United States)
James Malcolm, Georgia Institute of Technology (United States)
James Levitt, Brigham and Women's Hospital, Harvard Medical School (United States)
Martha E. Shenton, Brigham and Women's Hospital, Harvard Medical School (United States)
Allen Tannenbaum, Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6914:
Medical Imaging 2008: Image Processing
Joseph M. Reinhardt; Josien P. W. Pluim, Editor(s)

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