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Proceedings Paper

Intrinsic OLED emitter properties and their effect on device performance
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Paper Abstract

The optical properties of OLEDs can be tailored by optimization of the layer stack and by implementation of micro- and/or nano-optical structures. But the effect of changing the OLED configuration on the device performance crucially depends on the optical properties of the emissive layer. The aim of this contribution is twofold. First, we will propose and demonstrate a general and reliable method to determine the intrinsic optical emitter properties via simple optical characterization and corresponding reverse simulations. Second, the influence of the emitter properties on homogeneous OLEDs as well as on OLEDs with micro/nano-optical structures is discussed.

Paper Details

Date Published: 13 February 2008
PDF: 11 pages
Proc. SPIE 6910, Light-Emitting Diodes: Research, Manufacturing, and Applications XII, 691006 (13 February 2008); doi: 10.1117/12.769123
Show Author Affiliations
Christoph A. Wächter, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Norbert Danz, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Dirk Michaelis, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Michael Flämmich, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Sergey Kudaev, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Andreas H. Bräuer, Fraunhofer Institut für Angewandte Optik und Feinmechanik (Germany)
Malte C. Gather, Univ. zu Köln (Germany)
Klaus Meerholz, Univ. zu Köln (Germany)


Published in SPIE Proceedings Vol. 6910:
Light-Emitting Diodes: Research, Manufacturing, and Applications XII
Klaus P. Streubel; Heonsu Jeon, Editor(s)

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