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Proceedings Paper

Dark current measurements in a CMOS imager
Author(s): William C. Porter; Bradley Kopp; Justin C. Dunlap; Ralf Widenhorn; Erik Bodegom
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Paper Abstract

We present data for the dark current of a commercially available CMOS image sensor for different gain settings and bias offsets over the temperature range of 295 to 340 K and exposure times of 0 to 500 ms. The analysis of hot pixels shows two different sources of dark current. One source results in hot pixels with high but constant count for exposure times smaller than the frame time. Other hot pixels exhibit a linear increase with exposure time. We discuss how these hot pixels can be used to calculate the dark current for all pixels. Finally, we show that for low bias settings with universally zero counts for the dark frame one still needs to correct for dark current. The correction of thermal noise can therefore result in dark frames with negative pixel values. We show how one can calculate dark frames with negative pixel count.

Paper Details

Date Published: 29 February 2008
PDF: 8 pages
Proc. SPIE 6816, Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 68160C (29 February 2008); doi: 10.1117/12.769079
Show Author Affiliations
William C. Porter, Portland State Univ. (United States)
Bradley Kopp, Portland State Univ. (United States)
Justin C. Dunlap, Portland State Univ. (United States)
Ralf Widenhorn, Portland State Univ. and Digital Clarity Consultants (United States)
Erik Bodegom, Portland State Univ. and Digital Clarity Consultants (United States)


Published in SPIE Proceedings Vol. 6816:
Sensors, Cameras, and Systems for Industrial/Scientific Applications IX
Morley M. Blouke; Erik Bodegom, Editor(s)

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