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Proceedings Paper

Retinal thermal laser damage thresholds for different beam profiles and scanned exposure
Author(s): Karl Schulmeister; Reinhard Gilber; Bernhard Seiser; Florian Edthofer; Johannes Husinsky; Beate Fekete; Letizia Farmer
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Paper Abstract

A computer model was used to predict thresholds for 532 nm scanned retinal exposure and exposure for different retinal beam profile geometries, including rectangles and ring shaped profiles. The image analysis method described in IEC 60825-1 Edition 1.2--maximizing the ratio of power within a rectangle over the value of &agr; for this rectangle--was applied to the different profiles to determine &agr; and the fractional power that would be compared to the MPE value. The predicted thresholds for these special types of retinal exposure were compared with the predicted damage threshold for top hat profiles for the value of &agr; that resulted from the image analysis method. The comparison shows that the most restrictive power/&agr; ratio method produces appropriate results, provided that a time dependent &agr;max is used, as was proposed at BIOS 2006.

Paper Details

Date Published: 11 February 2008
PDF: 12 pages
Proc. SPIE 6844, Ophthalmic Technologies XVIII, 68441L (11 February 2008); doi: 10.1117/12.768671
Show Author Affiliations
Karl Schulmeister, Austrian Research Ctrs. GmbH (Austria)
Reinhard Gilber, Austrian Research Ctrs. GmbH (Austria)
Bernhard Seiser, Austrian Research Ctrs. GmbH (Austria)
Florian Edthofer, Austrian Research Ctrs. GmbH (Austria)
Johannes Husinsky, Austrian Research Ctrs. GmbH (Austria)
Beate Fekete, Austrian Research Ctrs. GmbH (Austria)
Letizia Farmer, Austrian Research Ctrs. GmbH (Austria)

Published in SPIE Proceedings Vol. 6844:
Ophthalmic Technologies XVIII
Bruce E. Stuck; Michael Belkin; Fabrice Manns; Per G. Söderberg; Arthur Ho, Editor(s)

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