Share Email Print
cover

Proceedings Paper

Optical probes of orientation-patterned ZnSe quasi-phase-matched devices
Author(s): G. S. Kanner; M. L. Marable; N. B. Singh; A. Berghmans; D. Kahler; B. Wagner; A. Lin; M. M. Fejer; J. S. Harris; K. L. Schepler
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Orientation-patterned zinc selenide (OPZnSe) is a unique quasi-phase-matched nonlinear optical material for enabling frequency conversion from visible to long-wave infrared wavelengths. We have fabricated and tested OPZnSe devices over a wide spectral range. Single crystal OPZnSe films of greater than 1 mm thickness were grown and characterized for optical loss showing an attenuation coefficient less than 0.05 cm-1 from 1 to 12 μm. We demonstrated nonlinear frequency conversion in the near infrared, mid-infrared, and long-wave infrared in these devices through a variety of nonlinear mixing processes.

Paper Details

Date Published: 13 February 2008
PDF: 8 pages
Proc. SPIE 6875, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII, 68750I (13 February 2008); doi: 10.1117/12.768553
Show Author Affiliations
G. S. Kanner, Northrop Grumman Electronic Systems (United States)
M. L. Marable, Northrop Grumman Electronic Systems (United States)
N. B. Singh, Northrop Grumman Electronic Systems (United States)
A. Berghmans, Northrop Grumman Electronic Systems (United States)
D. Kahler, Northrop Grumman Electronic Systems (United States)
B. Wagner, Northrop Grumman Electronic Systems (United States)
A. Lin, Stanford Univ. (United States)
M. M. Fejer, Stanford Univ. (United States)
J. S. Harris, Stanford Univ. (United States)
K. L. Schepler, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 6875:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII
Peter E. Powers, Editor(s)

© SPIE. Terms of Use
Back to Top