Share Email Print
cover

Proceedings Paper

Study on the degradation of PLEDs by in-situ micro-Raman spectroscopy
Author(s): Xiaoxuan Xu; Zhe Qin; Haibo Lin; Wei Xu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Electro luminescence spectra and in-suit micro-Raman spectra was used to study voltaic aging of organic light emitting devices with two kinds of conjugated macromolecule polymer emission layer, one is called PFO-BT15 and the other is poly (2-(4-Ethylhexyl) phenyl-1 , 4-phenylene vinylene) (P-PPV) polymer. The first device has a configuration of ITO glass/ PEDOT( 120nm ) PFO-BT15(80nm)/Ba( 4nm )/Al(200nm) , and we encapsulated the cathode of diode with epoxy resin to reduce the entrance of oxygen and water. After long time current stress, the electro luminescent spectra and Raman spectra show that the polymer device's molecular configuration of polymer layer is unchanged , but the PEDOT anode's breakage which lead to the emission failure of the device, which indicates that this kind of polymer materials have relatively steady photoelectric performance . The second device, during current stress , the reduction of conjugation length is provided by Raman spectroscopy. This reduction of the conjugation length , which dramatically increases the resistance and cuts off the current density , was the main reason for the failure of lighting. These findings provide an important insight into the intrinsic degradation mechanisms of the polymer LEDs and help in the development of even more stable devices.

Paper Details

Date Published: 14 January 2008
PDF: 5 pages
Proc. SPIE 6828, Light-Emitting Diode Materials and Devices II, 68280R (14 January 2008); doi: 10.1117/12.768383
Show Author Affiliations
Xiaoxuan Xu, Nankai Univ. (China)
Zhe Qin, Nankai Univ. (China)
Haibo Lin, Univ. of Missouri, Columbia (United States)
Wei Xu, South China Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6828:
Light-Emitting Diode Materials and Devices II
Jian Wang; Changhee Lee; Hezhou Wang, Editor(s)

© SPIE. Terms of Use
Back to Top