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Proceedings Paper

The Flux: creating a large annotated image database
Author(s): Daniel Tamburrino; Patrick Schönmann; Patrick Vandewalle; Sabine Süsstrunk
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Paper Abstract

From image retrieval to image classification, all research shares one common requirement: a good image database to test or train the algorithms. In order to create a large database of images, we set up a project that allowed gathering a collection of more than 33000 photographs with keywords and tags from all over the world. This project was part of the "We Are All Photographers Now!" exhibition at the Musee de l'Elysee in Lausanne, Switzerland. The "Flux," as it was called, gave all photographers, professional or amateur, the opportunity to have their images shown in the museum. Anyone could upload pictures on a website. We required that some simple tags were filled in. Keywords were optional. The information was collected in a MySQL database along with the original photos. The pictures were projected at the museum in five second intervals. A webcam snapshot was taken and sent back to the photographers via email to show how and when their image was displayed at the museum. During the 14 weeks of the exhibition, we collected more than 33000 JPEG pictures with tags and keywords. These pictures come from 133 countries and were taken by 9042 different photographers. This database can be used for non-commercial research at EPFL. We present some preliminary analysis here.

Paper Details

Date Published: 28 January 2008
PDF: 11 pages
Proc. SPIE 6808, Image Quality and System Performance V, 680816 (28 January 2008); doi: 10.1117/12.767609
Show Author Affiliations
Daniel Tamburrino, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Patrick Schönmann, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Patrick Vandewalle, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Sabine Süsstrunk, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

Published in SPIE Proceedings Vol. 6808:
Image Quality and System Performance V
Susan P. Farnand; Frans Gaykema, Editor(s)

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