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Proceedings Paper

FDTD-based optical simulations methodology for CMOS image sensor pixels architecture and process optimization
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Paper Abstract

This paper presents a new FDTD-based optical simulation model dedicated to describe the optical performances of CMOS image sensors taking into account diffraction effects. Following market trend and industrialization constraints, CMOS image sensors must be easily embedded into even smaller packages, which are now equipped with auto-focus and short-term coming zoom system. Due to miniaturization, the ray-tracing models used to evaluate pixels optical performances are not accurate anymore to describe the light propagation inside the sensor, because of diffraction effects. Thus we adopt a more fundamental description to take into account these diffraction effects: we chose to use Maxwell-Boltzmann based modeling to compute the propagation of light, and to use a software with an FDTD-based (Finite Difference Time Domain) engine to solve this propagation. We present in this article the complete methodology of this modeling: on one hand incoherent plane waves are propagated to approximate a product-use diffuse-like source, on the other hand we use periodic conditions to limit the size of the simulated model and both memory and computation time. After having presented the correlation of the model with measurements we will illustrate its use in the case of the optimization of a 1.75&mgr;m pixel.

Paper Details

Date Published: 29 February 2008
PDF: 12 pages
Proc. SPIE 6816, Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 681609 (29 February 2008); doi: 10.1117/12.766391
Show Author Affiliations
Flavien Hirigoyen, STMicroelectronics (France)
Axel Crocherie, STMicroelectronics (France)
IMEP (France)
Jérôme M. Vaillant, STMicroelectronics (France)
Yvon Cazaux, STMicroelectronics (France)

Published in SPIE Proceedings Vol. 6816:
Sensors, Cameras, and Systems for Industrial/Scientific Applications IX
Morley M. Blouke; Erik Bodegom, Editor(s)

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