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Proceedings Paper

Directional filter banks for detecting un-patterned TFT-LCD defect
Author(s): No Kap Park; Hye Won Kim; Suk In Yoo
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Paper Abstract

The thin film transistor liquid crystal display (TFT-LCD) has become an actively used front of panel display technology with an increasing market. Intrinsically there is a region of non uniformity with low contrast that to human eye is perceived as a defect. Because the grey-level difference between the defect and the background is small, the conventional edge detection techniques are hardly applicable to detect these low contrast defects. Although several effort were dedicated in classifying the patterned TFT-LCD defects, only few researches were conducted on detecting the unpatterned TFT-LCD defects that accounts for approximately 15% of all defects produced during the manufacturing stages. This paper proposes a detection method for the un-patterned TFT-LCD defects by using the directional filter bank (DFB), Shen-Castan filter and maximum Feret's diameter. The effectiveness of the proposed method is tested through the experiment using real TFT-LCD panel images.

Paper Details

Date Published: 26 February 2008
PDF: 9 pages
Proc. SPIE 6813, Image Processing: Machine Vision Applications, 68130U (26 February 2008); doi: 10.1117/12.766182
Show Author Affiliations
No Kap Park, Seoul National Univ. (South Korea)
Hye Won Kim, Seoul National Univ. (South Korea)
Suk In Yoo, Seoul National Univ. (South Korea)


Published in SPIE Proceedings Vol. 6813:
Image Processing: Machine Vision Applications
Kurt S. Niel; David Fofi, Editor(s)

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