Share Email Print

Proceedings Paper

Non referential method for defects inspection of TFT-LCD pad
Author(s): Hye Won Kim; Suk In Yoo
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Detecting defects is important technology of the TFT-LCD (Thin Film Transistor-Liquid Crystal Display) production process for quality control. For high quality and improving productive, defect detection is performed on each manufacturing process. In array process, defect inspection is divided into inspection for active matrix area and inspection for pad area. Inspection on active matrix area has used period of pattern to detect defect. As pad has non repetitive pattern, period can not be used for defect detection. Therefore, defects on pad have been detected by referential method comparing to pre-stored reference pad image. Subtraction has been used for comparison with reference pad. This method is problematic for pad defect inspection due to variance in the shapes of pad, illumination change and alignment error. In this paper, we propose the inspection method making up for limitation of referential method which has been used for TFT-LCD pad. Inspection is performed by applying morphological method to each horizontal line. By finding valley of each line, defect is detected.

Paper Details

Date Published: 26 February 2008
PDF: 8 pages
Proc. SPIE 6813, Image Processing: Machine Vision Applications, 68130V (26 February 2008); doi: 10.1117/12.766075
Show Author Affiliations
Hye Won Kim, Seoul National Univ. (South Korea)
Suk In Yoo, Seoul National Univ. (South Korea)

Published in SPIE Proceedings Vol. 6813:
Image Processing: Machine Vision Applications
Kurt S. Niel; David Fofi, Editor(s)

© SPIE. Terms of Use
Back to Top