Share Email Print

Proceedings Paper

Hybrid, contact, and no contact measurement system for industry
Author(s): Robert Sitnik; Jerzy Sładek; Magdalena Kupiec; Paweł Błaszczyk; Wojciech Załuski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The quality of industrial products is gradually increasing. In the same time, products and their parts most often have complex geometry which has to be described accurately by thousands or millions of measurement points. One of the most important quality control requirement is dimensional object to reference model consistency condition. Actually, large-size production process, especially in airplane, car and power industries, requires more effective measurement techniques. These new methods should introduce faster measurement speed and simultaneously high accuracy. In the paper we present a concept that combines the accuracy of Coordinate Measurement Machines (CMM) and the speed of full-field optical methods. We present a model of Opto-Mechanical Measurement Machine (OMMM) based on the integration of an optical measurement system with a CMM. To minimize measurement time, the following sequence is proposed: optical measurement of whole surface, data analysis, contact re-measurement of critical object's areas and final metrological characterization. To prove correctness of the OMMM idea a laboratory prototype had been constructed. In the paper some experimental results of car body measurement are presented with uncertainty sources discussion.

Paper Details

Date Published: 25 February 2008
PDF: 8 pages
Proc. SPIE 6805, Three-Dimensional Image Capture and Applications 2008, 680503 (25 February 2008); doi: 10.1117/12.765910
Show Author Affiliations
Robert Sitnik, Warsaw Univ. of Technology (Poland)
Jerzy Sładek, Cracow Univ. of Technology (Poland)
Magdalena Kupiec, Cracow Univ. of Technology (Poland)
Paweł Błaszczyk, Warsaw Univ. of Technology (Poland)
Wojciech Załuski, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 6805:
Three-Dimensional Image Capture and Applications 2008
Brian D. Corner; Masaaki Mochimaru; Robert Sitnik, Editor(s)

© SPIE. Terms of Use
Back to Top