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Proceedings Paper

Autonomously detecting the defective pixels in an imaging sensor array using a robust statistical technique
Author(s): Siddhartha Ghosh; Ian Marshall; Alex Freitas
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Paper Abstract

We propose a statistical technique for autonomously detecting defective pixels in a CCD sensor array. Our data-driven analysis technique can autonomously identify a wide range of faulty and 'suspect' pixels (hypo-sensitive or hyper-sensitive pixels), without the need for any defect model or prior knowledge of the nature of pixel faults. We apply our technique to the autonomous detection of the defective pixels in regular images captured with a camera, equipped with a CCD.

Paper Details

Date Published: 28 January 2008
PDF: 12 pages
Proc. SPIE 6808, Image Quality and System Performance V, 680813 (28 January 2008); doi: 10.1117/12.765147
Show Author Affiliations
Siddhartha Ghosh, Univ. of Kent (United Kingdom)
Ian Marshall, Lancaster Univ. (United Kingdom)
Alex Freitas, Univ. of Kent (United Kingdom)

Published in SPIE Proceedings Vol. 6808:
Image Quality and System Performance V
Susan P. Farnand; Frans Gaykema, Editor(s)

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