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Proceedings Paper

Four-tip scanning tunneling microscope for measuring transport in nanostructures
Author(s): Shuji Hasegawa; Shinya Yoshimoto; Rei Hobara
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Paper Abstract

By controlling four tips independently, mechanically and electrically, in an organic manner, we can do novel measurements in nanometer scales, which are impossible by single-tip scanning tunneling microscopes (STM). The four-tip STM makes possible to measure electrical properties of nano-scale devices and materials, and also to directly image Green's function that represents propagation of electron wavefunction. We can now bring two tips as close as 20 nm to each other by using conductive carbon-nanotube tips in the four-tip STM. A new controller which drives the four tips with a single computer is another important clue for practical use of the four-tip STM.

Paper Details

Date Published: 9 January 2008
PDF: 12 pages
Proc. SPIE 6800, Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV, 68000G (9 January 2008); doi: 10.1117/12.764823
Show Author Affiliations
Shuji Hasegawa, Univ. of Tokyo (Japan)
Shinya Yoshimoto, Univ. of Tokyo (Japan)
Rei Hobara, Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 6800:
Device and Process Technologies for Microelectronics, MEMS, Photonics, and Nanotechnology IV
Hark Hoe Tan; Jung-Chih Chiao; Lorenzo Faraone; Chennupati Jagadish; Jim Williams; Alan R. Wilson, Editor(s)

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