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Proceedings Paper

Reliability of ensembles multi-stripe laser diodes
Author(s): Ed Wolak; Kiran Kuppuswamy; Bernard Fidric; Sang-Ki Park; Daming Liu; Serge Cutillas; Kelly Johnson; Hanxuan Li; Irving Chyr; Frank Reinhardt; Robert Miller; Xu Jin; Touyen Nguyen; Terry Towe; Peggi Cross; Tom Truchan; Robert Bullock; Jeff Mott; James Harrison
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Paper Abstract

As GaAs based laser diode reliability improves, the optimum architecture for diode pumped configurations is continually re-examined. For such assessments, e.g. bars vs. single emitters, it is important to have a metric for module reliability which enables comparisons that are the most relevant to the ultimate system reliability. We introduce the concept of mean time between emitter failures (MTBEF) as a method for characterizing and specifying the reliability of multi-emitter pumps for ensemble applications. Appropriate conditions for an MTBEF model, and the impact of incremental changes of certain conditions on the robustness of the model are described. In the limit of independent random failures of individual emitters as the dominant failure mechanism it is shown that an ensemble of multi-emitter modules can be modeled to behave like an ensemble of single emitter modules. The impact of thermal acceleration due to failed emitters warming other emitters on a shared heat-sink is considered. Data taken from SP built multi-emitter devices bonded with AuSn on CTE matched heat-sinks is compared with the MTBEF model with and without correction for the thermal acceleration effect.

Paper Details

Date Published: 20 March 2008
PDF: 10 pages
Proc. SPIE 6876, High-Power Diode Laser Technology and Applications VI, 68760N (20 March 2008); doi: 10.1117/12.764348
Show Author Affiliations
Ed Wolak, Spectra-Physics Lasers (United States)
Kiran Kuppuswamy, Spectra-Physics Lasers (United States)
Bernard Fidric, Spectra-Physics Lasers (United States)
Sang-Ki Park, Spectra-Physics Lasers (United States)
Daming Liu, Spectra-Physics Lasers (United States)
Serge Cutillas, Spectra-Physics Lasers (United States)
Kelly Johnson, Spectra-Physics Lasers (United States)
Hanxuan Li, Spectra-Physics Lasers (United States)
Irving Chyr, Spectra-Physics Lasers (United States)
Frank Reinhardt, Spectra-Physics Lasers (United States)
Robert Miller, Spectra-Physics Lasers (United States)
Xu Jin, Spectra-Physics Lasers (United States)
Touyen Nguyen, Spectra-Physics Lasers (United States)
Terry Towe, Spectra-Physics Lasers (United States)
Peggi Cross, Spectra-Physics Lasers (United States)
Tom Truchan, Spectra-Physics Lasers (United States)
Robert Bullock, Spectra-Physics Lasers (United States)
Jeff Mott, Spectra-Physics Lasers (United States)
James Harrison, Spectra-Physics Lasers (United States)


Published in SPIE Proceedings Vol. 6876:
High-Power Diode Laser Technology and Applications VI
Mark S. Zediker, Editor(s)

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