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Proceedings Paper

Efficient calibration algorithm, and calibration pattern for correcting distortions for three-dimensional image acquisition systems for microscopic applications
Author(s): Wojtek J. Walecki; Fanny Szondy
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Paper Abstract

We present novel method for fully automated detection of calibration features. It reduces computation effort when compared to traditional corner, edge, and conic detection algorithms. Our method employs generalized method based on properties of prospective projection invariants [1], but is also applicable for the optical systems suffering high order, non-spherical distortions. We also show an example when in presence of significant barrel distortion procedure developed for ideal pinhole camera system outlined in [1] does not converge to unique solution. We suggest new modified algorithm which produces unique solution.

Paper Details

Date Published: 12 February 2008
PDF: 9 pages
Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610S (12 February 2008); doi: 10.1117/12.763917
Show Author Affiliations
Wojtek J. Walecki, Sunrise Optical LLC (United States)
Fanny Szondy, Sunrise Optical LLC (United States)


Published in SPIE Proceedings Vol. 6861:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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