Share Email Print
cover

Proceedings Paper

Direct visualization of tear film on soft contact lens using ultra-high resolution spectral domain optical coherence tomography
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The integrity of the tear film on the surface of contact lenses is essential to maintaining visual clarity and the overall health of the superficial structures of the eye (cornea and conjunctiva) for contact lens wearers. It is very critical to evaluate pre- and post-lens tear films in contact lens practice to make sure the lens is properly fitted. Improper lens fitting may cause ocular discomfort, visual distortion and ocular infection. It is very often for soft contact lens wearers to experience dry eye, especially in the afternoon after wearing the lens for a period of time. Dry eye has been a common cause of contact lens drop-off. There is currently no method available to directly visualize the tears on and underneath the contact lens in situ on human eye, mainly due to the extremely difficulty in imaging the micrometer-thin tear layer. An ultra-high resolution spectral domain optical coherence tomography has been developed with a telecentric light delivery system mounted with a slit-lamp. The system has a 3 micrometer depth resolution with a scan width up to 15 mm. The system was used to image soft contact lenses on the human eye. For the first time to our knowledge, tear films on the center and edge of the soft contact lens were directly visualized in vivo.

Paper Details

Date Published: 11 February 2008
PDF: 4 pages
Proc. SPIE 6844, Ophthalmic Technologies XVIII, 68441E (11 February 2008); doi: 10.1117/12.763852
Show Author Affiliations
Jianhua Wang, Univ. of Miami Miller School of Medicine (United States)
Shuliang Jiao, Univ. of Miami Miller School of Medicine (United States)
Marco Ruggeri, Univ. of Miami Miller School of Medicine (United States)
Hassan M. Wehbe, Univ. of Miami Miller School of Medicine (United States)


Published in SPIE Proceedings Vol. 6844:
Ophthalmic Technologies XVIII
Bruce E. Stuck; Michael Belkin; Fabrice Manns; Per G. Söderberg; Arthur Ho, Editor(s)

© SPIE. Terms of Use
Back to Top