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Proceedings Paper

Tunable narrow-bandwidth source of THz radiation based on frequency down-conversion in periodically structured gallium arsenide
Author(s): Joseph E. Schaar; Konstantin L. Vodopyanov; Paulina S. Kuo; Martin M. Fejer; Angie Lin; Xiaojun Yu; James S. Harris; David Bliss; Candace Lynch; Vladimir G. Kozlov; Walter Hurlbut
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Paper Abstract

We have efficiently generated tunable terahertz (THz) radiation using intracavity parametric down-conversion in gallium arsenide (GaAs). We used three types of micro-structured GaAs to quasi-phase-match the interaction: optically contacted, orientation-patterned, and diffusion-bonded GaAs. The room-temperature GaAs was placed in an optical parametric oscillator (OPO) cavity, and the THz wave was generated by difference-frequency mixing between the OPO signal and idler waves. 250-GHz-bandwidth radiation was generated with frequencies spanning 0.4-3.5 THz. We measured two orders of optical cascading generated by the mixing of optical and THz waves. In a doubly resonant oscillator (DRO) configuration, the efficiency increased by 21 times over the singly resonant oscillator (SRO) performance with an optical-to-THz efficiency of 10-4 and average THz power of 1 mW.

Paper Details

Date Published: 6 February 2008
PDF: 10 pages
Proc. SPIE 6893, Terahertz Technology and Applications, 689306 (6 February 2008); doi: 10.1117/12.763631
Show Author Affiliations
Joseph E. Schaar, Stanford Univ. (United States)
Konstantin L. Vodopyanov, Stanford Univ. (United States)
Paulina S. Kuo, Stanford Univ. (United States)
Martin M. Fejer, Stanford Univ. (United States)
Angie Lin, Stanford Univ. (United States)
Xiaojun Yu, Stanford Univ. (United States)
James S. Harris, Stanford Univ. (United States)
David Bliss, Air Force Research Lab. (United States)
Candace Lynch, Air Force Research Lab. (United States)
Vladimir G. Kozlov, Microtech Instruments, Inc. (United States)
Walter Hurlbut, Microtech Instruments, Inc. (United States)

Published in SPIE Proceedings Vol. 6893:
Terahertz Technology and Applications
Kurt J. Linden; Laurence P. Sadwick, Editor(s)

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