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Proceedings Paper

Gaussian beam mode analysis of phase gratings
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Paper Abstract

Gaussian Beam Mode Analysis can be applied as a powerful technique approach in the development of phase gratings for use at terahertz wavelengths, providing a physically intuitive approach relating Fourier and Fresnel diffraction patterns to the scattering of the illumination beam at the grating. Fourier gratings in particular offer the possibility of generating sparse arrays image of a single input beam, useful, for example, in active heterodyne systems with an LO power source. The feasibility of the application of such gratings in real systems was investigated both by simulation and experimental measurements.

Paper Details

Date Published: 14 February 2008
PDF: 9 pages
Proc. SPIE 6893, Terahertz Technology and Applications, 68930G (14 February 2008); doi: 10.1117/12.763624
Show Author Affiliations
Robert May, National Univ. of Ireland Maynooth (Ireland)
J. Anthony Murphy, National Univ. of Ireland Maynooth (Ireland)
Creidhe O'Sullivan, National Univ. of Ireland Maynooth (Ireland)
Marcin Gradziel, National Univ. of Ireland Maynooth (Ireland)
Neil Trappe, National Univ. of Ireland Maynooth (Ireland)


Published in SPIE Proceedings Vol. 6893:
Terahertz Technology and Applications
Kurt J. Linden; Laurence P. Sadwick, Editor(s)

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