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Proceedings Paper

Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution
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Paper Abstract

We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

Paper Details

Date Published: 20 February 2008
PDF: 8 pages
Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 68610J (20 February 2008); doi: 10.1117/12.763291
Show Author Affiliations
Jonas Kühn, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Tristan Colomb, Ctr. de Neurosciences Psychiatriques, DP-CHUV (Switzerland)
Christophe Pache, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Florian Charrière, Ecole Polytechnique Fédérale de Lausanne (Switzerland)
Frédéric Montfort, Lyncée Tec SA (Switzerland)
Etienne Cuche, Lyncée Tec SA (Switzerland)
Yves Emery, Lyncée Tec SA (Switzerland)
Pierre Marquet, Ctr. de Neurosciences Psychiatriques, DP-CHUV (Switzerland)
Christian Depeursinge, Ecole Polytechnique Fédérale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 6861:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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