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Proceedings Paper

Measurement of the nonlinear optical properties of semiconductors using the irradiance scan technique
Author(s): Leonel P. Gonzalez; Joel M. Murray; Vincent M. Cowan; Shekhar Guha
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Paper Abstract

Irradiance scan measurements of the nonlinear absorption and refraction coefficients of CdTe were performed at room temperature and at 77 K and compared to the values obtained in previous experiments using a different technique.

Paper Details

Date Published: 13 February 2008
PDF: 5 pages
Proc. SPIE 6875, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII, 68750R (13 February 2008); doi: 10.1117/12.763152
Show Author Affiliations
Leonel P. Gonzalez, General Dynamics Information Technology (United States)
Joel M. Murray, General Dynamics Information Technology (United States)
Vincent M. Cowan, Univ. of Dayton (United States)
Shekhar Guha, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 6875:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VII
Peter E. Powers, Editor(s)

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