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Proceedings Paper

A polarization measurement method for the quantification of retardation in optic nerve fiber layer
Author(s): Yasufumi Fukuma; Yoshio Okazaki; Takashi Shioiri; Yukio Iida; Hisao Kikuta; Kazuhiko Ohnuma
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Paper Abstract

The thickness measurement of the optic nerve fiber layer is one of the most important evaluations for carrying out glaucoma diagnosis. Because the optic nerve fiber layer has birefringence, the thickness can be measured by illuminating eye optics with circular polarized light and analyzing the elliptical rate of the detected polarized light reflected from the optic nerve fiber layer. In this method, the scattering light from the background and the retardation caused by the cornea disturbs the precise measurement. If the Stokes vector expressing the whole state of polarization can be detected, we can eliminate numerically the influence of the background scattering and of the retardation caused by the cornea. Because the retardation process of the eye optics can be represented by a numerical equation using the retardation matrix of each component and also the nonpolarized background scattering light, it can be calculated by using the Stokes vector. We applied a polarization analysis system that can detect the Stokes vector onto the fundus camera. The polarization analysis system is constructed with a CCD area image sensor, a linear polarizing plate, a micro phase plate array, and a circularly polarized light illumination unit. With this simply constructed system, we can calculate the retardation caused only by the optic nerve fiber layer and it can predict the thickness of the optic nerve fiber layer. We report the method and the results graphically showing the retardation of the optic nerve fiber layer without the retardation of the cornea.

Paper Details

Date Published: 11 February 2008
PDF: 9 pages
Proc. SPIE 6844, Ophthalmic Technologies XVIII, 68441A (11 February 2008); doi: 10.1117/12.762764
Show Author Affiliations
Yasufumi Fukuma, Topcon Corp. (Japan)
Yoshio Okazaki, Topcon Corp. (Japan)
Takashi Shioiri, Topcon Corp. (Japan)
Yukio Iida, Komazawa Univ. (Japan)
Hisao Kikuta, Osaka Prefectural Univ. (Japan)
Kazuhiko Ohnuma, Chiba Univ. (Japan)

Published in SPIE Proceedings Vol. 6844:
Ophthalmic Technologies XVIII
Bruce E. Stuck; Michael Belkin; Fabrice Manns; Per G. Söderberg; Arthur Ho, Editor(s)

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