Share Email Print
cover

Proceedings Paper

Focus characterization for laser micromachining under real process conditions
Author(s): Harald Schwede; Otto W. Märten; Reinhard Kramer; Stefan Wolf; Volker Brandl
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The result in laser material processing is controlled mainly by the properties of the focused laser beam. Very special requirements have to be taken into account to characterize such a laser beam, which is finally used for laser micromachining. These specific aspects for the design of a beam diagnostics system ready to measure small spots (down the 10 micrometer range) at power densities up to several GW/cm2 will be discussed. Based on a CCD-camera concept, care has to be taken to magnify and to attenuate the beam properly. A special electronics design and algorithms are necessary to optimize the performance and finally to realize such a technical measuring system. Some applications of beam diagnostics within industrial processes (drilling holes, cutting wafers etc.) are demonstrated.

Paper Details

Date Published: 13 February 2008
PDF: 7 pages
Proc. SPIE 6872, Laser Resonators and Beam Control X, 687208 (13 February 2008); doi: 10.1117/12.762675
Show Author Affiliations
Harald Schwede, Primes GmbH (Germany)
Otto W. Märten, Märten Opto Consulting (Germany)
Reinhard Kramer, Primes GmbH (Germany)
Stefan Wolf, Primes GmbH (Germany)
Volker Brandl, Primes GmbH (Germany)


Published in SPIE Proceedings Vol. 6872:
Laser Resonators and Beam Control X
Alexis V. Kudryashov; Alan H. Paxton; Vladimir S. Ilchenko, Editor(s)

© SPIE. Terms of Use
Back to Top