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Proceedings Paper

Improvement in the light sensitivity of the ultrahigh-speed high-sensitivity CCD with a microlens array
Author(s): T, Hayashida; J. Yonai; K. Kitamura; T. Arai; T. Kurita; K. Tanioka; H. Maruyama; T. Goji Etoh; S. Kitagawa; K. Hatade; T. Yamaguchi; H. Takeuchi; K. Iida
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Paper Abstract

We are advancing the development of ultrahigh-speed, high-sensitivity CCDs for broadcast use that are capable of capturing smooth slow-motion videos in vivid colors even where lighting is limited, such as at professional baseball games played at night. We have already developed a 300,000 pixel, ultrahigh-speed CCD, and a single CCD color camera that has been used for sports broadcasts and science programs using this CCD. However, there are cases where even higher sensitivity is required, such as when using a telephoto lens during a baseball broadcast or a high-magnification microscope during science programs. This paper provides a summary of our experimental development aimed at further increasing the sensitivity of CCDs using the light-collecting effects of a microlens array.

Paper Details

Date Published: 22 February 2008
PDF: 9 pages
Proc. SPIE 6890, Optical Components and Materials V, 68900M (22 February 2008); doi: 10.1117/12.762632
Show Author Affiliations
T, Hayashida, NHK Science & Technical Research Labs. (Japan)
J. Yonai, NHK Science & Technical Research Labs. (Japan)
K. Kitamura, NHK Science & Technical Research Labs. (Japan)
T. Arai, NHK Science & Technical Research Labs. (Japan)
T. Kurita, NHK Science & Technical Research Labs. (Japan)
K. Tanioka, NHK Science & Technical Research Labs. (Japan)
H. Maruyama, NHK Science & Technical Research Labs. (Japan)
T. Goji Etoh, Kinki Univ. (Japan)
S. Kitagawa, Nalux Co., Ltd. (Japan)
K. Hatade, Nalux Co., Ltd. (Japan)
T. Yamaguchi, Nalux Co., Ltd. (Japan)
H. Takeuchi, Nalux Co., Ltd. (Japan)
K. Iida, Nano Control Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 6890:
Optical Components and Materials V
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

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