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Proceedings Paper

Mapping of photoreceptor dysfunction using high resolution three-dimensional spectral optical coherence tomography
Author(s): B. L. Sikorski; M. Szkulmowski; J. J. Kałużny; T. Bajraszewski; A. Kowalczyk; M. Wojtkowski
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Paper Abstract

The ability to obtain reliable information on functional status of photoreceptor layer is essential for assessing vision impairment in patients with macular diseases. The reconstruction of three-dimensional retinal structure in vivo using Spectral Optical Coherence Tomography (Spectral OCT) became possible with a recent progress of the OCT field. Three-dimensional data collected by Spectral OCT devices comprise information on light intensity back-reflected from the junction between photoreceptor outer and inner segments (IS/OS) and thus can be used for evaluating photoreceptors impairment. In this paper, we introduced so called Spectral OCT reflectivity maps - a new method of selecting and displaying the spatial distribution of reflectivity of individual retinal layers. We analyzed the reflectivity of the IS/OS layer in various macular diseases. We have measured eyes of 49 patients with photoreceptor dysfunction in course of age-related macular degeneration, macular holes, central serous chorioretinopathy, acute zonal occult outer retinopathy, multiple evanescent white dot syndrome, acute posterior multifocal placoid pigment epitheliopathy, drug-induced retinopathy and congenital disorders.

Paper Details

Date Published: 11 February 2008
PDF: 5 pages
Proc. SPIE 6844, Ophthalmic Technologies XVIII, 68440J (11 February 2008); doi: 10.1117/12.762626
Show Author Affiliations
B. L. Sikorski, Nicolaus Copernicus Univ. (Poland)
M. Szkulmowski, Nicolaus Copernicus Univ. (Poland)
J. J. Kałużny, Nicolaus Copernicus Univ. (Poland)
T. Bajraszewski, Nicolaus Copernicus Univ. (Poland)
A. Kowalczyk, Nicolaus Copernicus Univ. (Poland)
M. Wojtkowski, Nicolaus Copernicus Univ. (Poland)


Published in SPIE Proceedings Vol. 6844:
Ophthalmic Technologies XVIII
Bruce E. Stuck; Michael Belkin; Fabrice Manns; Per G. Söderberg; Arthur Ho, Editor(s)

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