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Proceedings Paper

Spectral tag method for enhancing FBG multiplexing capability
Author(s): Ki-Sun Choi; Ju-Youn Son; Geun-Jin Kim; Kyung-Shin Lee; Dong-Young Park; Se-Jong Baik; Jae-Soon Youn; Kiegon Im; Jae-Min Kim; Young-Sang Kim
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Paper Abstract

Fiber Bragg gratings (FBGs) have been frequently employed for the strain and temperature measurement in many distributed sensor systems. For multipoint measurements with a very large number of measurement points such as smart structure applications, the multiplexing of FBG sensors is one of the most detrimental techniques to reduce both installation and operation cost for multipoint measurements. We proposed a new method of increasing the multiplexing capability of a multipoint FBG sensor system without increasing the system complexity by providing a unique spectral response to each FBG at a different location as an identification tag. FBG elements were fabricated to furnish reflectance spectrums to have a multi peaked structure. The number of sensors in the present spectral tag method increases as a multiple power of N, the number of spectral code. The free spectral range available for spanning the parameter to be measured is as wide as a substantial fraction of the whole spectral bandwidth of the system.

Paper Details

Date Published: 5 February 2008
PDF: 9 pages
Proc. SPIE 6890, Optical Components and Materials V, 689013 (5 February 2008); doi: 10.1117/12.762371
Show Author Affiliations
Ki-Sun Choi, Chonnam National Univ. (South Korea)
Ju-Youn Son, Chonnam National Univ. (South Korea)
Geun-Jin Kim, Chonnam National Univ. (South Korea)
Kyung-Shin Lee, Chonnam National Univ. (South Korea)
Dong-Young Park, Chonnam National Univ. (South Korea)
Se-Jong Baik, Chonnam National Univ. (South Korea)
Jae-Soon Youn, Chonnam National Univ. (South Korea)
Kiegon Im, Chonnam National Univ. (South Korea)
Jae-Min Kim, Chonnam National Univ. (South Korea)
Young-Sang Kim, Chonnam National Univ. (South Korea)

Published in SPIE Proceedings Vol. 6890:
Optical Components and Materials V
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

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