Share Email Print
cover

Proceedings Paper

QSIP: phase imaging made possible in a bright field microscope
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Quantitative structured-illumination phase microscopy (QSIP) uses a conventional bright field microscope to quantitatively measure the optical path length profiles of homogenous phase-only objects. The illumination in QSIP is structured with a predetermined pattern by placing an amplitude mask in the field diaphragm of the microscope. From the image of the amplitude mask, a numerical algorithm implementing a closed form analytical solution calculates the object's optical path length profile. In this paper, we investigate the accuracy of the numerical algorithm used and show that it can be made arbitrarily accurate by using numerical optimization. We then analyze the effect of the system's numerical aperture (NA), and show that QSIP can be used with a wide range of NAs for objects with small phase gradients, and can be used with relatively lower NAs for objects with large phase gradients.

Paper Details

Date Published: 12 February 2008
PDF: 7 pages
Proc. SPIE 6861, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, 686105 (12 February 2008); doi: 10.1117/12.762131
Show Author Affiliations
Sri Rama Prasanna Pavani, Univ. of Colorado at Boulder (United States)
Ariel R. Libertun, Univ. of Colorado at Boulder (United States)
Sharon V. King, Univ. of Colorado at Boulder (United States)
Carol J. Cogswell, Univ. of Colorado at Boulder (United States)
CDM Optics Inc. (United States)


Published in SPIE Proceedings Vol. 6861:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top