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Proceedings Paper

Long-term frequency stabilisation of a CW single-frequency laser using a high-precision wavelength meter
Author(s): Sergey Kobtsev; Stepan Kandrushin; Andrey Potekhin
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Paper Abstract

In the present paper it has been demonstrated that the suggested and for the first time experimentally tested method for considerable reduction in long-term radiation frequency drift of CW single-frequency Ti:Sapphire and dye lasers based on a fast high-precision radiation wavelength meter and a digital-analogue feed-back system can present an efficient alternative to conventional methods for long-term frequency stabilisation. Long-term frequency drift of the lasers was improved from ~450 MHz/h in free-running regime to less than 40 MHz/h in the regime of frequency stabilisation. Application of a wavelength meter as a spectral reference allows reduction in the long-term frequency drift down to the level of residual drift inherent in the wavelength meter. An interesting prospective feature of the suggested method is the possibility to use a wavelength meter for periodical operative wavelength correction of more than one laser, which can also be performed remotely when a laser and the wavelength meter are connected with a long optical waveguide and the wavelength value is transmitted though the Internet. The proposed method of stabilisation can be used for single-frequency lasers of any type (solid-state, diode, fibre, dye lasers, etc.), in which continuous controlled radiation frequency detuning is possible.

Paper Details

Date Published: 5 March 2008
PDF: 8 pages
Proc. SPIE 6871, Solid State Lasers XVII: Technology and Devices, 68712H (5 March 2008); doi: 10.1117/12.761813
Show Author Affiliations
Sergey Kobtsev, Novosibirsk State Univ. (Russia)
Tekhnoscan Joint-Stock Co. (Russia)
Stepan Kandrushin, Tekhnoscan Joint-Stock Co. (Russia)
Andrey Potekhin, Novosibirsk State Univ. (Russia)

Published in SPIE Proceedings Vol. 6871:
Solid State Lasers XVII: Technology and Devices
W. Andrew Clarkson; Norman Hodgson; Ramesh K. Shori, Editor(s)

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