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Proceedings Paper

1 W reliable operation of broad area lasers and 8 W reliable operation of 5 mm wide laser bars at 650 nm
Author(s): B. Sumpf; M. Zorn; J. Fricke; P. Ressel; H. Wenzel; G. Erbert; M. Weyers; G. Tränkle
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Paper Abstract

Reliability tests for 650 nm broad area lasers and bars with GaInP quantum wells embedded in AlGaInP waveguide layers and n-AlInP and p-AlGaAs cladding layers will be presented. Reliable operation of broad area lasers with 100 μm stripe width at 1.0 W output power over 10,000 h and of 5 mm wide bars with ten 100 μm wide emitters (filling factor 20%) at 8 W over 4,000 h will be reported. 6 mm wide bars with twelve 60 μm wide emitters (filling factor 12%) at 7 W showed a mean time to failure of 3,750 h.

Paper Details

Date Published: 13 February 2008
PDF: 6 pages
Proc. SPIE 6876, High-Power Diode Laser Technology and Applications VI, 68760T (13 February 2008); doi: 10.1117/12.761558
Show Author Affiliations
B. Sumpf, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
M. Zorn, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
J. Fricke, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
P. Ressel, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
H. Wenzel, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
G. Erbert, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
M. Weyers, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
G. Tränkle, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)


Published in SPIE Proceedings Vol. 6876:
High-Power Diode Laser Technology and Applications VI
Mark S. Zediker, Editor(s)

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