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Proceedings Paper

Depth scanning with wavelength-stepped laser-diode interferometer
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Paper Abstract

We develop a laser-diode (LD) interferometer for depth profiling. Interference signals are produced by the reflections from the reference mirror and the distributed objects. Four-step current modulation into the LD produces phase shifts with four steps that have a value proportional to the distance from the reference mirror image to the reflection cite and the modulation amplitude. The value of phase shift is gradually increased by changing the amplitude of current modulation. The locations of the reflection cite are measured from the modulation amplitude when the value of phase shifts is suited to π/2.

Paper Details

Date Published: 26 November 2007
PDF: 7 pages
Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 682909 (26 November 2007); doi: 10.1117/12.760940
Show Author Affiliations
Ribun Onodera, Univ. of Industrial Technology (Japan)
Yukihiro Ishii, Tokyo Univ. of Science (Japan)


Published in SPIE Proceedings Vol. 6829:
Advanced Materials and Devices for Sensing and Imaging III
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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