Share Email Print
cover

Proceedings Paper

Research on 10.6 μm laser beam monitoring in CO2 laser processing system
Author(s): Yali Shi; Yunguo Gao; Weijie Deng; Shuai Shao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It is a key point of CO2 laser beam monitoring in the CO2 laser processing system to achieve alignment between CO2 laser and PL (pointing and launching) system. By monitoring the angle offset of CO2 laser beam, the compensation can be gotten witch is given to fast-steering mirror to rectify the direction of laser beam. But the normal photoelectric detector can not get the laser signal because of CO2 laser's high energy and long wavelength. Its wavelength is 10.6μm and its power can reach kW level. Consequently, it is difficult to detect the high-energy 10.6μm laser beam directly. So, we monitored the output mirror of laser resonator superseded the laser beam, indirectly. The laser beam monitoring system could be designed based on CCD laser auto-collimation angular measurement principle and image processing method. In this paper, application of CCD laser auto-collimation angular measurement principle and image processing method for CO2 laser beam monitoring system is introduced particularly, After design, fabrication and alignment, the monitoring system can be used for experimental study that including angular measurement accuracy and angle offset measurement of CO2 laser beam. Angle offset range and angle variation rule of CO2 laser beam is also can be acquired for further research.

Paper Details

Date Published: 23 January 2008
PDF: 6 pages
Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 683521 (23 January 2008); doi: 10.1117/12.760300
Show Author Affiliations
Yali Shi, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yunguo Gao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Weijie Deng, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Shuai Shao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6835:
Infrared Materials, Devices, and Applications
Yi Cai; Haimei Gong; Jean-Pierre Chatard, Editor(s)

© SPIE. Terms of Use
Back to Top