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Proceedings Paper

Online non-contact detection for LED chips
Author(s): Ping Li; Lian Li; Jing Wen; Yumei Wen
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Paper Abstract

An online non-contact fault detection technique of LED chips is presented based on the photovoltaic effect in diodes. By observing the current in the bonding lead frame of a LED chip, which is induced by illuminating the chip, the LED chip and its electric connection with the lead frame during packaging are checked. The fault detection principle is described in detail in this paper. Red, yellow and green LED chips are tested in the experiment. The experimental results show that the method can be easily realized, and thus can be used for online fault detection of LED chips in packaging.

Paper Details

Date Published: 20 November 2007
PDF: 5 pages
Proc. SPIE 6828, Light-Emitting Diode Materials and Devices II, 68280X (20 November 2007); doi: 10.1117/12.760235
Show Author Affiliations
Ping Li, Chongqing Univ. (China)
Lian Li, Chongqing Univ. (China)
Jing Wen, Chongqing Univ. (China)
Yumei Wen, Chongqing Univ. (China)


Published in SPIE Proceedings Vol. 6828:
Light-Emitting Diode Materials and Devices II
Jian Wang; Changhee Lee; Hezhou Wang, Editor(s)

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