Share Email Print
cover

Proceedings Paper

A novel biosensor for rapid identification of high temperature resistant species
Author(s): Lingrui Zhang; Da Xing; Xiaoming Zhou
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, a novel biosensor technique for identification of high temperature resistant species based on quantitative measurement of delayed fluorescence (DF) is described. The biosensor, which uses light-emitting diode lattice as excitation light source, is portable and can detect DF emission from plants in vivo. Compared with its primary version in our previous report, the biosensor presented here can better control environmental factors. Moreover, the improved biosensor can automatically complete the measurements of light response curves of DF intensity in a programmed mode. The testing of the improved biosensor has been made in two maize species (Zea May L.) after high temperature treatment. Contrast evaluations of the effects of heat stress on seedlings photosynthesis were made from measurements of net photosynthesis rate (Pn) based on consumption of CO2. Current testing has demonstrated that the DF intensity well correlates with Pn in each plant species after heat stress. We thus conclude that the DF technique is a breakthrough to traditional strategy of identifying the differences in heat tolerance based on gas exchange, and can provide a reliable approach for rapid and non-invasive determination of the effects of heat stress on photosynthesis and identification of high temperature resistant species.

Paper Details

Date Published: 26 November 2007
PDF: 8 pages
Proc. SPIE 6830, Advanced Sensor Systems and Applications III, 683027 (26 November 2007); doi: 10.1117/12.760225
Show Author Affiliations
Lingrui Zhang, South China Normal Univ. (China)
Da Xing, South China Normal Univ. (China)
Xiaoming Zhou, South China Normal Univ. (China)


Published in SPIE Proceedings Vol. 6830:
Advanced Sensor Systems and Applications III
Yun-Jiang Rao; Yanbiao Liao; Gang-Ding Peng, Editor(s)

© SPIE. Terms of Use
Back to Top