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Proceedings Paper

Reflective terahertz en-face tomography
Author(s): Xinke Wang; Ye Cui; Wenfeng Sun; Yan Zhang
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Paper Abstract

In this presentation, a system for THz en-face tomography imaging is proposed. The THz radiation reflected by the object is imaged on the ZnTe crystal, and then a CCD is used to detect the two dimensional modulated probe light. By adjusting the delay line, the information about the object can be achieved layer by layer. Expanded terahertz pulses are reflected from the different medium interfaces inside a sample, the amplitudes and time decays of these pulses can be used to determine the thickness of each medium inside the sample. In this way, the structure image of the sample can be reconstructed. The longitudinal resolution of the system is discussed by using the timing information of the reflection terahertz pulses.

Paper Details

Date Published: 4 January 2008
PDF: 8 pages
Proc. SPIE 6840, Terahertz Photonics, 68400F (4 January 2008); doi: 10.1117/12.760136
Show Author Affiliations
Xinke Wang, Harbin Institute of Technology (China)
Capital Normal Univ. (China)
Ye Cui, Capital Normal Univ. (China)
Wenfeng Sun, Capital Normal Univ. (China)
Yan Zhang, Capital Normal Univ. (China)

Published in SPIE Proceedings Vol. 6840:
Terahertz Photonics
Cunlin Zhang; Xi-Cheng Zhang, Editor(s)

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