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Proceedings Paper

Hydrogen sensor using optical reflectance from porous silicon with a palladium thin film
Author(s): Christopher Lowrie; Susan Earles; M. de Fernandez
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Paper Abstract

Results of a hydrogen sensor based on light scattering from a porous silicon surface coated with a thin palladium film are discussed. Reflected light scattered from the rough surface of porous silicon surface with a thin palladium film is compared before and after exposure to hydrogen gas. After exposure to hydrogen gas the sensor's optical reflectance is decreased indicating the presence of hydrogen.

Paper Details

Date Published: 13 February 2008
PDF: 7 pages
Proc. SPIE 6898, Silicon Photonics III, 689818 (13 February 2008); doi: 10.1117/12.759198
Show Author Affiliations
Christopher Lowrie, Florida Institute of Technology (United States)
Susan Earles, Florida Institute of Technology (United States)
M. de Fernandez, Florida Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6898:
Silicon Photonics III
Joel A. Kubby; Graham T. Reed, Editor(s)

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