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Proceedings Paper

Photothermal detuning: a sensitive technique for absorption measurement of optical thin films
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Paper Abstract

A simple and sensitive photothermal technique-photothermal detuning (PTDT), which is based on the absorption-induced shift of reflectance or transmission spectrum of an optical coating, is developed to measure the absorption of coated optical components. A PTDT theory is developed to describe the signal's dependence on the structural parameters of the optical coatings and on the geometric parameters of the experimental configuration. An experiment is performed to measure the PTDT signal of a highly reflective multilayer coating used in 532nm by using a probe beam with a wavelength of 632.8nm. By optimizing the incident angle of the probe beam, the measurement sensitivity is maximized. Good agreements between the theoretical predictions and experimental results are obtained.

Paper Details

Date Published: 20 December 2007
PDF: 8 pages
Proc. SPIE 6720, Laser-Induced Damage in Optical Materials: 2007, 67201D (20 December 2007); doi: 10.1117/12.758949
Show Author Affiliations
Honggang Hao, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Bincheng Li, Institute of Optics and Electronics (China)
Mingqiang Liu, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yuan Gong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 6720:
Laser-Induced Damage in Optical Materials: 2007
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M. J. Soileau; Christopher J. Stolz, Editor(s)

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