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Proceedings Paper

Screening of high power laser diode bars in terms of stresses and thermal profiles
Author(s): Jens W. Tomm; Mathias Ziegler; Tran Quoc Tien; Fritz Weik; Petra Hennig; Jens Meusel; Heiko Kissel; Gabriele Seibold; Jens Biesenbach; Guenther Groenninger; Gerhard Herrmann; Uwe Strauß
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Paper Abstract

Within the project TRUST a total of about 600 actively cooled high power laser diode bars is analyzed. These devices are packaged by various project partners and by applying different packaging technologies. A number of analytical tools is applied to the devices, among others strain profiling by photocurrent spectroscopy. We present selected results such as the evolution of packaging-induced strains when advancing the technology from indium- to AuSn-soldering. The thermal properties of all devices are screened before the aging experiments by using thermal imaging. This involves monitoring of complete thermal profiles along each bar as well as the identification of "hot" emitters. These statistics turns out to be batch-specific and sensitive to the soldering technology used.

Paper Details

Date Published: 13 February 2008
PDF: 7 pages
Proc. SPIE 6876, High-Power Diode Laser Technology and Applications VI, 687619 (13 February 2008); doi: 10.1117/12.758877
Show Author Affiliations
Jens W. Tomm, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Mathias Ziegler, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Tran Quoc Tien, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Fritz Weik, Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Petra Hennig, JENOPTIK Laserdiode GmbH (Germany)
Jens Meusel, JENOPTIK Laserdiode GmbH (Germany)
Heiko Kissel, DILAS Diodenlaser GmbH (Germany)
Gabriele Seibold, DILAS Diodenlaser GmbH (Germany)
Jens Biesenbach, DILAS Diodenlaser GmbH (Germany)
Guenther Groenninger, OSRAM Opto Semiconductors GmbH (Germany)
Gerhard Herrmann, OSRAM Opto Semiconductors GmbH (Germany)
Uwe Strauß, OSRAM Opto Semiconductors GmbH (Germany)


Published in SPIE Proceedings Vol. 6876:
High-Power Diode Laser Technology and Applications VI
Mark S. Zediker, Editor(s)

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