Share Email Print
cover

Proceedings Paper

Automatic optical inspection for chip components based on local principal wave probability
Author(s): Jianjie Wu; Feng Sun; Yongxin Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An automatic optical inspection algorithm for chip components which is based on local principal wave probability is presented. The gray-level change of component image in local feature region is used as a detection criterion. By introducing local principal wave probability, the similarity between sample image and inspected image is described by intrinsic characteristic of the principal wave. Thus it can be decided whether the component is a defective one. Furthermore the type of defect can also be concluded. Experimental results show that the algorithm can be real-time by reducing the computation from the whole image to local region. It solves the problem of high sensitivity to position of component that exists in the algorithms widely used in automatic optical inspection for chip components.

Paper Details

Date Published: 28 November 2007
PDF: 10 pages
Proc. SPIE 6833, Electronic Imaging and Multimedia Technology V, 683307 (28 November 2007); doi: 10.1117/12.758815
Show Author Affiliations
Jianjie Wu, Huazhong Univ. of Science and Technology (China)
Feng Sun, Huazhong Institute of Electro-Optics (China)
Yongxin Wang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6833:
Electronic Imaging and Multimedia Technology V
Liwei Zhou; Chung-Sheng Li; Minerva M. Yeung, Editor(s)

© SPIE. Terms of Use
Back to Top