Share Email Print

Proceedings Paper

Beam deflection measurement using Moire deflectometry and Talbot interferometry
Author(s): Z. Y. Chen; S. H. Leung; P. S. Chung
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper introduces a new and simple concept of moire effect. A circular grating placed at Talbot planes can achieve beam deflection measurement in real time. It is not only used for 2-D beam shift measurement at every point, but also used to measure the angle and plane parallel degree of optical element and birefringence measurement of the optical material.

Paper Details

Date Published: 4 January 2008
PDF: 5 pages
Proc. SPIE 6832, Holography and Diffractive Optics III, 68321A (4 January 2008); doi: 10.1117/12.758176
Show Author Affiliations
Z. Y. Chen, City Univ. of Hong Kong (Hong Kong China)
Shanghai Institute of Optics and Fine Mechanics (China)
S. H. Leung, City Univ. of Hong Kong (Hong Kong China)
P. S. Chung, City Univ. of Hong Kong (Hong Kong China)

Published in SPIE Proceedings Vol. 6832:
Holography and Diffractive Optics III
Yunlong Sheng; Dahsiung Hsu; Chongxiu Yu, Editor(s)

© SPIE. Terms of Use
Back to Top