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Proceedings Paper

A wavelength calibration process for micro-spectrometers with multichannel detectors
Author(s): Xingyue Huang; Huaidong Yang; Qingsheng He; Guofan Jin
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Paper Abstract

An advanced wavelength calibration process with higher wavelength accuracy is developed based on the conventional calibration method of micro-spectrometers with multichannel detectors. The deficiencies of the conventional method in acquiring sufficient well-spaced and adequately accurate wavelength-pixel data for calibration are analyzed. And three steps are added to the conventional method before the final pixel-wavelength fit is carried out. First, segmented data collection is carried out to ensure sufficient well-spaced lines for calibration. Second, sub-pixel analysis is executed to increase sampling rate. Third, peak fit is implemented to acquire more accurate central wavelength positions. The simulated experiment was based on a compact spectrometer with a crossed Czerny-Turner optical design. Mercury and Argon line spectra are used as wavelength standards. A linear image sensor with 1024 pixels each 25μm in width is used as the detector. In the new calibration process the whole spectral region was divided into two segments with different integral time of the detector; the sampling rate was increased by 2 times by sub-pixel analysis; and log-normal function is applied in the peak fit. The results show that by applying the new method, the wavelength accuracy improves from above 1.0nm to around 0.6nm.

Paper Details

Date Published: 24 January 2008
PDF: 11 pages
Proc. SPIE 6829, Advanced Materials and Devices for Sensing and Imaging III, 68291Q (24 January 2008); doi: 10.1117/12.757399
Show Author Affiliations
Xingyue Huang, Tsinghua Univ. (China)
Huaidong Yang, Tsinghua Univ. (China)
Qingsheng He, Tsinghua Univ. (China)
Guofan Jin, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 6829:
Advanced Materials and Devices for Sensing and Imaging III
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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