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Proceedings Paper

Characterization of high-speed optoelectronics devices based optical and electrical spectra analyses
Author(s): Ji Min Wen; Tao Zhang
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Paper Abstract

In this paper, we presents the characterization technique of high-speed optoelectronics devices based electrical and optical spectra, which is as important access to the devices performance as the prevalent vector network analyzer (VNA) sweeping method. The measurement of additional modulation of laser and frequency response of photodetector from electrical spectra, and the estimation of the modulation indexes and the chirp parameters of directly modulated lasers based on optical spectra analysis, are given as examples.

Paper Details

Date Published: 5 February 2008
PDF: 5 pages
Proc. SPIE 6838, Optoelectronic Devices and Integration II, 68380Q (5 February 2008); doi: 10.1117/12.757336
Show Author Affiliations
Ji Min Wen, Institute of Semiconductors (China)
Tao Zhang, Institute of Semiconductors (China)

Published in SPIE Proceedings Vol. 6838:
Optoelectronic Devices and Integration II
Xuping Zhang; Hai Ming; Maggie Yihong Chen, Editor(s)

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