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Proceedings Paper

Measurement and analysis of microwave frequency response of semiconductor optical amplifiers
Author(s): Jian Liu; Shang-Jian Zhang; Yong-Hong Hu; Liang Xie; Yong-Zhen Huang; Ning-Hua Zhu
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Paper Abstract

The measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (SOAs) are proposed in this paper. The response is measured using a vector network analyzer. Then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the SOA is extracted. Some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. The multisectional model of an SOA is then used to analyze the response theoretically. By deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. Then by iterating the expression, the response of the whole SOA is simulated. The simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. This proves the validity of the theoretical analysis.

Paper Details

Date Published: 7 January 2008
PDF: 11 pages
Proc. SPIE 6824, Semiconductor Lasers and Applications III, 682406 (7 January 2008); doi: 10.1117/12.757119
Show Author Affiliations
Jian Liu, Institute of Semiconductors (China)
Shang-Jian Zhang, Univ. of Electronic Science and Technology of China (China)
Yong-Hong Hu, Institute of Semiconductors (China)
Liang Xie, Institute of Semiconductors (China)
Yong-Zhen Huang, Institute of Semiconductors (China)
Ning-Hua Zhu, Institute of Semiconductors (China)

Published in SPIE Proceedings Vol. 6824:
Semiconductor Lasers and Applications III
Lianghui Chen; Hiroyuki Suzuki; Paul T. Rudy; Ninghua Zhu, Editor(s)

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