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Proceedings Paper

An infrared single photon detector based on avalanche photodiodes with transmission lines
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Paper Abstract

A new method to detect infrared single photon using avalanche photodiodes is proposed, which combine the requirements of a single photon detector control circuit and features of the electric pulses generator by transient process of transmission lines. When the terminated boundary conditions of transmission lines are changed quickly, voltage across the switch devices will drop suddenly in the electric pulses generator model and at the same time a signal that can reflect the drive information of the switch device will export from load resistance. So we can replace the switch with avalanche photodiodes who can act as an excellent optoelectronic switch. Then when faint laser pulses enter the avalanche photodiode, resistance of the avalanche photodiode will decrease quickly and with that voltage across avalanche photodiodes will drop simultaneously and a signal that can reflect the single-photon laser pulses will export from the load resistance. The simulation results are given for the new quenching circuit model of avalanche photodiodes and the analyses emphasis on the feasibility of the quenching model and the influence of each electrical component on the performance of the quenching circuit. Finally optimal parameter of the electrical components in the model is demonstrated.

Paper Details

Date Published: 26 November 2007
PDF: 12 pages
Proc. SPIE 6827, Quantum Optics, Optical Data Storage, and Advanced Microlithography, 68270R (26 November 2007); doi: 10.1117/12.756983
Show Author Affiliations
Jin-dong Wang, South China Normal Univ. (China)
Bing Zhang, South China Normal Univ. (China)
Zheng-jun Wei, South China Normal Univ. (China)
Chang-jun Liao, South China Normal Univ. (China)
Song-hao Liu, South China Normal Univ. (China)


Published in SPIE Proceedings Vol. 6827:
Quantum Optics, Optical Data Storage, and Advanced Microlithography
Chris A. Mack; Jinfeng Kang; Jun-en Yao; Guangcan Guo; Song-hao Liu; Osamu Hirota; Guofan Jin; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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