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Proceedings Paper

Electronic and thermal nonlinear refractive indices of SOI and nano-patterned SOI measured by Z-scan method
Author(s): A. Petris; F. Pettazzi; E. Fazio; C. Peroz; Y. Chen; V. I. Vlad; M. Bertolotti
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Paper Abstract

We measure electronic and thermal nonlinear refractive indices of periodically nano-patterned and un-patterned siliconon- insulator (SOI) in comparison with that of bulk silicon, using a fast reflection Z-scan setup with a high-repetition-rate fs laser (at 800 nm wavelength), and a new procedure for discrimination between electronic and thermal nonlinearities. The electronic nonlinear response of nano-structured SOI is strongly enhanced in comparison with those of un-patterned SOI and of bulk Si. These results could be important in silicon photonics for optical devices with nonlinearity controlled by periodic nano-structuring.

Paper Details

Date Published: 1 August 2007
PDF: 7 pages
Proc. SPIE 6785, ROMOPTO 2006: Eighth Conference on Optics, 67850P (1 August 2007); doi: 10.1117/12.756845
Show Author Affiliations
A. Petris, National Institute for Lasers, Plasma and Radiation Physics (Romania)
F. Pettazzi, Univ. La Sapienza (Italy)
INFM (Italy)
E. Fazio, Univ. La Sapienza (Italy)
INFM (Italy)
C. Peroz, Lab. de Photonique et de Nanostructures, CNRS (France)
Y. Chen, Lab. de Photonique et de Nanostructures, CNRS (France)
V. I. Vlad, National Institute for Lasers, Plasma and Radiation Physics (Romania)
M. Bertolotti, Univ. La Sapienza (Italy)
INFM (Italy)


Published in SPIE Proceedings Vol. 6785:
ROMOPTO 2006: Eighth Conference on Optics

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