Share Email Print

Proceedings Paper

Photonic bandgap properties of nanostructured materials fabricated with glancing angle deposition
Author(s): Matthew M. Hawkeye; Michael J. Brett
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Glancing angle deposition (GLAD) is a thin film fabrication method providing dynamic control over the internal columnar microstructure of the deposited film. Using the GLAD technique it is possible to control the porosity of the coating allowing precise tailoring of the optical properties. Therefore, in a single material system, the refractive index profile of the film can be engineered to create a variety of multilayer structures. The focus of this research is on the optical properties of these structured thin films. When the structure is periodic, incident radiation is subject to constructive and destructive scattering which lead to photonic bandgap effects. Also of interest are the optical properties of aperiodic systems, such as the Thue-Morse multilayer, which are deterministic but non-periodic. The complex structural correlations in aperiodic systems lead to interesting bandgap-like properties. Applying the GLAD technique, periodic and aperiodic optical lattices are fabricated with titanium dioxide, a dielectric material commonly used in optical coating devices. The bandgap properties of these systems are investigated using transmittance spectroscopy and transfer matrix calculations.

Paper Details

Date Published: 4 January 2008
PDF: 10 pages
Proc. SPIE 6832, Holography and Diffractive Optics III, 683204 (4 January 2008); doi: 10.1117/12.756818
Show Author Affiliations
Matthew M. Hawkeye, Univ. of Alberta (Canada)
Michael J. Brett, Univ. of Alberta (Canada)
National Research Council of Canada (Canada)

Published in SPIE Proceedings Vol. 6832:
Holography and Diffractive Optics III
Yunlong Sheng; Dahsiung Hsu; Chongxiu Yu, Editor(s)

© SPIE. Terms of Use
Back to Top