Share Email Print
cover

Proceedings Paper

Rays propagation in optical tunnel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical tunnels are widespread in mircolithographic illumination systems. It reshapes the rays and illuminates masks with dose-and-directional uniformity. Rays were focused the input end, reflected by the walls of the optical tunnel and lapped over the output end. According to rays reflecting by walls, optical tunnel was expanded along the reflecting walls. The approaches of rays' propagation in the optical tunnel were given. It indicates the luminance of the source is important for the optical tunnel performance; the defect of small inclination between bottom and top walls are neglectable for the uniformity of the output end. The taper of tunnel leads to the dissimilar of rays NA between output end and input end. The relation of the NA was given. The indications were confirmed by the simulations. When a collimated beam was focused on the input end, simulations show that the dropping of nonuniformity was unsmooth as the optical tunnel length increasing. When the luminance turned to a Gaussian distribution, the uniformity improved greatly. The uniformity of the output will be insensitivity with a fitting luminance. The nonuniformity would be less than 0.7% when the radius diminished less than the half. The edges' defect degrade the uniformity greatly both confirmed by the simulations and experiments. It shows that optical tunnels with sharp edges are excellent optical integrators with fitting luminance sources.

Paper Details

Date Published: 28 November 2007
PDF: 7 pages
Proc. SPIE 6834, Optical Design and Testing III, 68340A (28 November 2007); doi: 10.1117/12.756633
Show Author Affiliations
Zhijie Liao, Institute of Optics and Electronics (China)
Graduate School of Chinese Academy of Sciences (China)
Tingwen Xing, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

© SPIE. Terms of Use
Back to Top