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Proceedings Paper

Photoelectricity measurement of pattern in dielectric barrier discharge system
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Proc. SPIE 6838, Optoelectronic Devices and Integration II, ; doi: 10.1117/12.756310
Show Author Affiliations
Weili Liu, Hebei Univ. (China)
Lifang Dong, Hebei Univ. (China)
Yafeng He, Hebei Univ. (China)
Zengchao Zhao, Hebei Univ. (China)
Hongfang Wang, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 6838:
Optoelectronic Devices and Integration II
Xuping Zhang; Hai Ming; Maggie Yihong Chen, Editor(s)

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