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Proceedings Paper

Automatic target detection in dual band infrared imagery
Author(s): Jiancheng Yu; Shengli Sun; Guilin Chen
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Paper Abstract

Automatic target detection (ATD) in infrared imagery is challenging problem to Surveillance and Reconnaissance application. Though the recent of advances of remote sensing instrument which significantly improve system's spatial resolution and sensitivity, the size of many infrared targets is equivalent to or even smaller than pixel resolution. Therefore target recognition must be carried out within one pixel. Under such circumstance, traditional image processing techniques generally can not perform well in applications. The paper presented here investigates the issue and presents a novel algorithm for automatic target recognition in dual band infrared imagery with no priori knowledge. It consists of two stage processes, clutter rejection in infrared imagery of each band and followed by target detection with the fusion of the two bands of infrared images. Morphologic method instead of spatial-based processing techniques is applied in clutter rejection. An alternative way is Top-hat which gains a good performance in images with small targets. An in fusion center, dual-band infrared images are fused according to the AND rule whereas the decision rules are obtained from Neyman-Pearson (NP) criterion. A simple method of gaining each sensor's threshold with optimization has been developed. Relative simulations, assuming noise in infrared system is subjected to Gaussian distribution, shows the fusion result with a greater performance than either one even one's performance has been greatly degraded. Experimental results are presented using dual bands of registered infrared imagery to evaluate the performance of the new algorithm. It is suggested that the method presented above is robust, feasible and effective in this application.

Paper Details

Date Published: 8 January 2008
PDF: 9 pages
Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 68351L (8 January 2008); doi: 10.1117/12.756266
Show Author Affiliations
Jiancheng Yu, Graduate School of Chinese Academy of Sciences (China)
Shanghai Institute of Technical Physics (China)
Shengli Sun, Shanghai Institute of Technical Physics (China)
Guilin Chen, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 6835:
Infrared Materials, Devices, and Applications
Yi Cai; Haimei Gong; Jean-Pierre Chatard, Editor(s)

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