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Proceedings Paper

Preliminary analysis and experiment of thermal influence on a large-aperture mirror
Author(s): Wei-jie Hu; Peng-mei Xu; Hua-Peng Zhang; Lei Zhao; Guang-chun Bian; Xin Yu; Xin-qi Hu
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Paper Abstract

Thermal distortion of the optical elements can greatly reduce the high resolution of the space-borne camera. The general thermal effect on mirror is analyzed and the optical aberration of the optical surface resulting from 3 kinds of thermal gradient is discussed. The thermal distortion simulating experiment of a large aperture flat mirror is designed and the optical aberration is tested on 18" ZYGO with the different axial thermal disturb. The testing results conclude that the small thermal gradient can greatly affect the wave-front, the aberration of this large aperture flat mirror can be used to simulate the thermal distortion on space, and MTF is also reduced greatly when this large aperture flat mirror is used in the real space-borne camera under the same thermal environment. In order to correct the thermal distortion and keep the high resolution, the 37-units adaptive optics correction close loop experiment is designed and installed in the above camera. The correction results show that MTF of the testing camera will not reduced greatly under the large thermal distortion. So employing adaptive optics on a high resolution space camera is the necessary and the valid method to correct

Paper Details

Date Published: 21 January 2008
PDF: 9 pages
Proc. SPIE 6834, Optical Design and Testing III, 68342R (21 January 2008); doi: 10.1117/12.756243
Show Author Affiliations
Wei-jie Hu, Beijing Institute of Technology (China)
Peng-mei Xu, Beijing Institute of Space Mechanics and Electronics (China)
Hua-Peng Zhang, Beijing Institute of Technology (China)
Lei Zhao, Beijing Institute of Technology (China)
Guang-chun Bian, Beijing Institute of Technology (China)
Xin Yu, Beijing Institute of Technology (China)
Xin-qi Hu, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

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