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Proceedings Paper

A new method of evaluating counting efficiency based on signal amplitude response function
Author(s): Juan Yang; Fang Gu; Gang Peng; Baomin Bian; Jian Lu
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Paper Abstract

In order to accurately measure counting efficiency of laser airborne particle counter, the characteristics and shortages of the signal amplitude response functions of domestic instruments were analyzed firstly. Then the design of performance optimization for optical sensors was developed through using sheath air inlets to replace the original inlets, which can cause the signal amplitude response functions to be described by the normal distribution. Base on these, a new method for calculating counting efficiency was presented. Through analyzing the relation between signal amplitude response function and coordinate origin, the counting efficiency for mono-disperse particles can be confirmed. If the signal amplitude response function intersected with the coordinate axis, fitting the incomplete curve into the complete curve using non-linear Least Square Method, then the counting efficiency can be defined as the ratio of the included area of the incomplete curve to the complete curve. If the whole signal amplitude response function totally diverged from the coordinate origin, it proved that the counting efficiency of mono-disperse particles was up to 100%. The theory and experiments prove that this method is simple, useful and practical. It also offers the clear guidance direction for appraising performance of the instrument.

Paper Details

Date Published: 21 January 2008
PDF: 7 pages
Proc. SPIE 6834, Optical Design and Testing III, 68342O (21 January 2008); doi: 10.1117/12.756200
Show Author Affiliations
Juan Yang, Nanjing Univ. of Science and Technology (China)
Fang Gu, Nanjing Univ. of Science and Technology (China)
Gang Peng, Nanjing Univ. of Science and Technology (China)
Baomin Bian, Nanjing Univ. of Science and Technology (China)
Jian Lu, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 6834:
Optical Design and Testing III
Yongtian Wang; Theo T. Tschudi; Jannick P. Rolland; Kimio Tatsuno, Editor(s)

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