Share Email Print

Proceedings Paper

Performance and reliability characteristic of Stirling cryocoolers
Author(s): X. G. Liu; Y. N. Wu; L. He
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

With extensive application of infrared detective techniques, Stirling cryocoolers, used as an active cooling source, have been developed vigorously in China. An overview of the status and performance for some Stirling cryocoolers having been developed is presented. To analyze the cooler's reliability characteristic, failure analysis has been done, and the four crucial failure modes affecting cooler's long-life running are wear, gaseous contamination, Helium leakage and fatigue. According to each failure mechanism, the measures taken to control or minimize its damage were discussed, and some experiments were designed and carried to quantitatively analyze the relationship between failure and performance in detail. To the wear, an ageing test, which was thermal cycle and for about 500 h, was used to improve the internal frication status and eliminate the defective products. To the gaseous contamination, an accelerated experiment was carried by adding contaminants to the cooler by a 3-way valve to get the relationship between performance degradation and amount of contaminants. The chance of a fatigue related failure is very small now because of the FEM analysis and screening test. Based on charge pressure experiment results, the criteria to judge the sealing procedure was given by the ratio of leak rate to cooler volume.

Paper Details

Date Published: 8 January 2008
PDF: 7 pages
Proc. SPIE 6835, Infrared Materials, Devices, and Applications, 68350B (8 January 2008); doi: 10.1117/12.756136
Show Author Affiliations
X. G. Liu, Shanghai Institute of Technical Physics (China)
Y. N. Wu, Shanghai Institute of Technical Physics (China)
L. He, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 6835:
Infrared Materials, Devices, and Applications
Yi Cai; Haimei Gong; Jean-Pierre Chatard, Editor(s)

© SPIE. Terms of Use
Back to Top